Exposure to 50 Hz Extremely-Low-Frequency Magnetic Fields Induces No DNA Damage in Cells by Gamma H2AX Technology
Abstract
Overview
The ongoing debate concerning the biological impacts of extremely-low-frequency magnetic fields (ELF-MF) on DNA integrity necessitates more systematic and sensitive research techniques.
Findings
This comprehensive study employed the γH2AX marker, a sensitive indicator to detect DNA damage, to assess the effects of 50 Hz ELF-MF on various human cell types including amnion epithelial cells, skin fibroblast cells, and umbilical vein endothelial cells. These cells were exposed to varying intensities (0.4, 1, and 2 mT) and durations (15 min, 1 h, and 24 h) of ELF-MF.
- Post-exposure evaluations were conducted using γH2AX immunofluorescence and western blot methods.
- Statistical analysis revealed no significant differences between the control and exposure groups in terms of the number of γH2AX foci per cell, the percentage of foci-positive cells, or γH2AX expression levels (P > 0.05).
Conclusion
In light of the findings, 50 Hz ELF-MF exposure does not induce DNA damage in the studied cell types, regardless of intensity or exposure duration. This underscores the necessity for ongoing research into the safety of ELF-MFs.