Exposure to 50 Hz Extremely-Low-Frequency Magnetic Fields Induces No DNA Damage in Cells by Gamma H2AX Technology

Authors: Ye Lv, Shuchang Chen, Bing Zhu, Hong Xu, Shanshan Xu, Weiyan Liu, Yunyun Shen, Qunli Zeng

Year: 2021 Feb 15

Category: Biomedical Research

Journal: Biomed Res Int

Institution: Biomed Res Int

DOI: 10.1155/2021/8510315

URL: https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7899753/

Abstract

Overview

The ongoing debate concerning the biological impacts of extremely-low-frequency magnetic fields (ELF-MF) on DNA integrity necessitates more systematic and sensitive research techniques.

Findings

This comprehensive study employed the γH2AX marker, a sensitive indicator to detect DNA damage, to assess the effects of 50 Hz ELF-MF on various human cell types including amnion epithelial cells, skin fibroblast cells, and umbilical vein endothelial cells. These cells were exposed to varying intensities (0.4, 1, and 2 mT) and durations (15 min, 1 h, and 24 h) of ELF-MF.

  • Post-exposure evaluations were conducted using γH2AX immunofluorescence and western blot methods.
  • Statistical analysis revealed no significant differences between the control and exposure groups in terms of the number of γH2AX foci per cell, the percentage of foci-positive cells, or γH2AX expression levels (P > 0.05).

Conclusion

In light of the findings, 50 Hz ELF-MF exposure does not induce DNA damage in the studied cell types, regardless of intensity or exposure duration. This underscores the necessity for ongoing research into the safety of ELF-MFs.

← Back to Stats