Abstract

Overview

Electromagnetic interference (EMI) of cardiovascular implantable electronic devices (CIED) can lead to malfunctions and pose a significant danger for implant carriers, particularly with the increasing use of DC technologies and the accompanying growth in static field exposure.

Findings

• A combination of approaches was used to determine thresholds for EMI by static fields, including both literature review and numerical simulations.
• Four interference mechanisms were identified due to static magnetic fields with threshold limits, noting significant risks even below certain levels (<0.8 mT).
• Static electric fields (SEF) did not show significant direct interference with implantable devices under typical conditions, although indirect effects such as contact currents might still pose risks.
• Despite current standards, there might be an ongoing need to revise safety thresholds as new DC technologies continue to evolve.

Conclusion

The study determined key activation thresholds for motion-induced EMI relevant to clinical settings and revealed ongoing risks for CIED patients, highlighting the need for ongoing monitoring and possibly updating safety standards to protect this vulnerable population better.